Crystals | Free Full-Text | Radiation Defects in Heterostructures 3C-SiC/4H- SiC
Raman spectra of nitrogen-doped 4H–SiC. (a) Spectrum measured with the... | Download Scientific Diagram
Raman scattering of polycrystalline 3C–SiC film deposited on AlN buffer layer by using CVD with HMDS - ScienceDirect
Raman spectra of virgin and irradiated 4H-SiC single crystals for 2.64... | Download Scientific Diagram
Raman analysis of defects in n-type 4H-SiC
SciELO - Brasil - Effect of impurities on the Raman scattering of 6H-SiC crystals Effect of impurities on the Raman scattering of 6H-SiC crystals
.jpg "inVia Raman Microscope – Analyzing Silicon Carbide (SiC)")
inVia Raman Microscope – Analyzing Silicon Carbide (SiC)
Temperature and doping dependence of the Raman scattering in 4H-SiC
What Raman spectroscopy can tell you
Identification of selective oxidation of TiC/SiC composite with X-ray diffraction and Raman spectroscopy
Linear response calculation of first‐order Raman spectra of point defects in silicon carbide - Roma - 2016 - physica status solidi (a) - Wiley Online Library
Photoluminescence in fluorescent 4H-SiC single crystal adjusted by B, Al, and N ternary dopants<xref rid="cpb_28_1_017101fn1" ref-type="fn">*</xref><fn id="cpb_28_1_017101fn1"><label>*</label><p>Project supported by the National Key Research and ...
SciELO - Brasil - Effect of impurities on the Raman scattering of 6H-SiC crystals Effect of impurities on the Raman scattering of 6H-SiC crystals
Effect of doping on the Raman scattering of 6H-SiC crystals - ScienceDirect
Raman spectra of 6H–SiC. (a) Spectrum measured with the incident beam... | Download Scientific Diagram
Tailoring of stoichiometry and band-tail emission in PLD a-SiC thin films by varying He deposition pressure | SpringerLink
Raman spectra (black) for 4H-SiC single crystals irradiated with (a) U... | Download Scientific Diagram
Surface-enhanced Raman Scattering of Graphene on SiC | NTT Technical Review
Tip-enhanced Raman spectroscopic measurement of stress change in the local domain of epitaxial graphene on the carbon face of 4H-SiC(000-1). | Semantic Scholar
Analysis of SiC fibres and composites using Raman microscopy - Young - 1999 - Journal of Microscopy - Wiley Online Library
Raman characterization of damaged layers of 4H-SiC induced by scratching: AIP Advances: Vol 6, No 1
Crystals | Free Full-Text | Radiation Defects in Heterostructures 3C-SiC/4H- SiC
.jpg "Using the inVia Raman Microscope to Analyse Silicon Carbide (SiC)")
Using the inVia Raman Microscope to Analyse Silicon Carbide (SiC)
Micro-Raman Mapping of 3C-SiC Thin Films Grown by Solid–Gas Phase Epitaxy on Si (111) | SpringerLink
